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Overcoming spin-coating challenges for square substrates

Process application engineers often encounter a variety of complex challenges related to deposition by spin coating, as many variables affect the quality of the spin-applied coating. These variables have critical effects on the overall coating uniformity, coating thickness, and subsequent device yield. Some of the more influential variables that must be controlled precisely are spin…

  Wafer-Level packaging, coat uniformity, spin coat, spin process, square substrate Click Here to Read More

Processing wafers with high-topography 3-D structures

Over the past decade, Brewer Science has developed and published various methods of creating a planar surface over three-dimensional (3-D) structures. Sharing these results invariably leads to a potential customer asking, “Can you fill the holes in my substrate that are x in size?” The short answer to the question is “Yes, we can.” Filling…

  Wafer-Level packaging, planarization, TSV Click Here to Read More

Solvent vapor control for optimal thick-film spin coating

One of the most critical variables in spin-coating processes is coating uniformity. In many cases, engineers are challenged with achieving ultralow total thickness variation at high film thicknesses while conserving expensive materials. To achieve such a highly uniform coating, automated control of the solvent vapors is essential. A closed bowl environment combined with a programmable…

  Wafer-Level packaging, coat uniformity, thick-film, spin coat Click Here to Read More

Heat and Lateral Force: A Perfectly Complex Debonding Process

As part of its efforts to make devices faster and more efficient, Brewer Science is on the cutting edge of the technology that allows more transistors to fit into the same integrated circuit footprint as in the past. A 3-D stacking process uses a new bonding material and 300-mm wafer bonders to effectively solve the…

  Wafer-Level packaging, 3D Stacking, BrewerBOND 220, Heat, Debonding Process, Lateral Force Click Here to Read More
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